High-throughput characterisation and inline process monitoring of 2D semiconductor films
University of Cambridge
CDT in Developing National Capabilities for Materials 4.0
The project aim is to support the industrial translation of emerging ultrathin 2D semiconductor materials by developing smart metrology and best-practice approaches to fingerprint and monitor material quality characteristics across entire process pathways. Read more
Supervisors: Prof S Hofmann, Prof M Chhowalla
16 May 2025
PhD Research Project
Funded PhD Project (Students Worldwide)