Nanoscale characterisation of microLED devices via electron microscopies

This project will be concerned with nanoscale characterisation of microLED devices via electron microscopies at the Electron Microscopy Facility at the University of St Andrews. MicroLEDs, in addition to their applications in flat panel display technology, offer significant advantages to traditional interconnects in integrated circuits where high bandwidth is crucial, such as in high performance computing architectures. Despite the maturity of semiconductor research, significant challenges remain in optimising the complex nanoscale heterostructures of these devices and how their long term operational stability contributes to device reliability. The project will entail:

• Aberration-corrected scanning transmission electron microscopy (STEM) will be used predominantly to determine the composition and corresponding strain/uniformity of quantum wells in addition to assessing the various interfaces present within devices all of which is to be related back to the macroscopic functional properties.
• Reliability and stability will be addressed alongside accelerating aging tests.
• Focused ion beam (FIB) and scanning electron microscopy (SEM) will also play significant roles in sample preparation and for investigation of failure/aging mechanisms in devices, along with 3D reconstruction or “slice and view”.
• Complementing the multifaceted experimental work will be the chance to develop data processing procedures employing, for example, MATLAB and Python.

This project offers the opportunity for global travel as well as developing a comprehensive and highly-desirable skill set.

Further information and informal enquiries may be directed to Professor John Irvine, email: [Email Address Removed]