This research project is one of a number of projects at this institution. It is in competition for funding with one or more of these projects. Usually the project which receives the best applicant will be awarded the funding. The funding is available to citizens of a number of European countries (including the UK). In most cases this will include all EU nationals. However full funding may not be available to all applicants and you should read the full department and project details for further information.
. R. Vattikonda, W. Wang, and Y. Cao, "Modeling and Minimization of PMOS NBTI Effect for Robust Nanometer Design," Proceedings of the IEEE/ACM Design Automation Conference, pp. 1047-1052, July 2006.
. W. Wang et al., "The Impact of NBTI on the Performance of Combinational and Sequential Circuits," Proceedings of the IEEE/ACM Design Automation Conference, pp. 364-369, June 2007.
. H. Dogan, D. Forte, and M. Tehranipoor, "Aging Analysis for Recycled FPGA Detection," Proceedings of the International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, pp. 171-176, October 2014.
. K. M. Zick and J. P. Hayes, "On-Line Sensing for Healthier FPGA Systems," Proceedings of the FPT Conference, pp. 239-248, February 2010.
. C. Leong et al., "Aging Monitoring with Local Sensor in FPGA-Based Designs," Proceedings of the International Conference on Field programmable Logic and Applications, September 2013.
FTE Category A staff submitted: 44.86
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