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Surface Scanning using near-friend Microwave Microscopy

Project Description

This project combines the world class expertise of Renishaw in manufacturing and metrology with Cardiff’s Centre for High Frequency Engineering, using near field microwave microscopy for post machine verification of metal structures. We will focus on structures that would be otherwise difficult to assess using traditional methods such as coordinate measurement machines (CMM). Using the electric field interaction with the sample at the microwave probe tip, we will be able to assess (with exquisite accuracy) small capacitance changes associated with tip-to-surface distance and hence surface morphology. It is expected that the microwave probe could be incorporated into Renishaw’s commercial CMMs, to offer unparalleled versatility.

Candidates should hold or expect to gain a first class degree or a good 2.1 and/or an appropriate Master’s level qualification (or their equivalent) in a relevant degree, ideally in Electrical/Electronic Engineering, Mechanical Engineering or Physics. The project is mostly hardware-based, with some software elements linked to instrument control and data acquisition.

Applicants whose first language is not English will be required to demonstrate proficiency in the English language (IELTS 6.5 or equivalent)

Funding Notes

The studentship is open to: UK students; EU students who have been resident in the UK for three years at the course start date; other candidates who can demonstrate a connection to the UK, usually through residency.

The full four year award will cover fees at the Home/EU rate and will provide an annual stipend (£14,777 in 2018/19) with an enhancement.


In the first instance interested applicants are invited to send a CV and covering email/letter to [email protected]


Shortlisted candidates will be invited to submit an online application form.

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