Advanced Magnetic Microscopy Techniques:improving and developing novel methodology

Scanning probe microscopy (SPM) is widely recognized as one of the most important techniques for surface measurements with nanoscale accuracy. Magnetic force microscopy (MFM) is a specific SPM mode allowing for the acquisition of information about magnetization distributions with high resolution. MFM is extensively used in the data storage industry for recording media imaging or investigations of magnetic head prototypes. Less traditionally but still very successfully, variations of the technique have been utilized in life science applications, such as medical and pharmaceutical research and testing, e.g. for targeted drug delivery with magnetic nanoparticles. Nevertheless, to answer many open questions and issues both in fundamental nanomagnetism and technology applications, some crucial capabilities of MFM should be improved and novel methodology has to be developed.
This project aims at:
- obtaining quantitative information about the sample under investigations (still one of the most important issues in modern microscopy);
- development of advanced magnetic microscopy modes, specifically magnetic scanning gate microscopy with a series of custom-designed nanoprobes.
The work will be an essential part of the large European network project (EMPIR JRP Nanomag), which aims at providing validated MFM calibration techniques; development, testing and validation of different calibration approaches; establishing traceability of novel MFM approaches.
We envisage that the PhD student will most of the time at NPL (~75%) and RHUL (~25%) with occasional working visits to PTB (Germany), INRIM (Italy), CMI (Czech Republic).
The work will involve:
- Magnetic imaging and determination of the domain structure;
- Development and implementation of advanced microscopic methods;
- Development of the approach for quantitative analysis of MFM images;
- Design and fabrication of magnetic nanodevices and custom-made probes;
- Measurement of magnetotransport properties of nanodevices.
Skills to develop:
- Basic (AFM, MFM, EFM) and advanced (SGM, SKPM, sSNOM) SPM techniques ;
- Nanofabrication techniques (thin film deposition, lithography, FIB, etc.);
- Transport and noise measurements in nanodevices (LabView modelling, transport measurement setup, spectrum analyser, etc.);
- Advance transport measurements (4-probe STM, including Cryogenic, high magnetic field operation)
- Numerical modelling (MATLAB, COMSOL).

To apply please email your CV and a cover letter to: [Email Address Removed]

Royal Holloway, University of London will host an Open Day for Post-Graduate Research on 30th November 2016. See here (link https://www.royalholloway.ac.uk/physics/documents/pdf/prospectivestudents/pg-open-day-poster-2016.pdf )